Please use the links below and the "back" button of your browser to navigate through our product CD.
About Boin
Starting Page
Products
WAFERMAP
Features
Download
Screen shots
Licenses
Solutions for OEM's
Revision History
WAFERView.OCX
Features
Download
Licenses
Revision History
PANELMAP
Features
Download
Screen shots
Licenses
Solutions for OEM's
Revision History
Sales
Press Releases
Newsletter/ More Info
Boin in the Press
Publications
Links
Metrology software for the semiconductor industry. Download the evaluation copy of WAFERMAP or PANELMAP. Read, analyze and visualize data files from semiconductor metrology equipment.
Please use the links below and the "back" button of your browser to navigate through our product CD.
About Boin
Starting Page
Products
WAFERMAP
Features
Download
Screen shots
Licenses
Solutions for OEM's
Revison History
Wafermap-View.OCX
Features
Download
Licenses
Revison History
PANELMAP
Features
Download
Screen shots
Licenses
Solutions for OEM's
Revison History
Sales
Press Releases
Newsletter/ More Info
Boin in the Press
Publications
Links