Tomerdingen (Germany) - For immediate release - April 12, 1999
Hologenix, Inc, a manufacturer and integrator of semiconductor inspection and metrology equipment is pleased to announce that it has been selected as the exclusive distributor in the United States for Boin GmbH's metrology software WAFERMAP. Dr. Manuela Boin, one of the founders of Boin GmbH, said: "Selecting Hologenix as the WAFERMAP distributor in the important North American market is the first step towards a global presence for our product."
Boin GmbH, located in Tomerdingen, Germany, recently released version 1.1 of its metrology software WAFERMAP. The software is typically used in wafer fabs and at equipment suppliers for production and off-line metrology data analysis and visualization. It can import data files from metrology equipment such as thickness gauges, ellipsometers and four point probes used within the semiconductor industry.
WAFERMAP can be used to visualize data as 1D, 2D (contour), 3D plots and histograms. It can also be used offline to analyze and print measurement data outside of the clean room. It serves as a tool to standardize the display of wafer data and to allow for an easy comparison between multi-point measurements from different metrology tools. In addition, it allows for exporting of data to other software tools via ASCII or by using the OPUS file format.
The software is already licensed to a number of worldwide IC manufacturers and equipment vendors, as well as many universities and institutes.
A free Evaluation Copy of WAFERMAP can be downloaded at Download.
Larry Schott, Manager, Product Development Hologenix, Inc.
Boin GmbH, Dr. Manuela Boin
Tel: +49 (0) 7348-928233