PANELMAP

Advanced xml-based Boin multi-column multi-panel file format
Loading of multiple columns and panels at once
Configurable 1D- (line scan), 2D- (contour or colored), 3D- (solid or wire frame), 3D bar chart-, value-, and sigma range plots
Multicolor contour plot
Statistical analysis (histogram, calculation of mean, standard deviation, max, min, etc.)
Import functions for data from different metrology tools (AIT CMT 5000, E+H, Filmetrics, GP-Solar, OMT)
Import of data from metrology tools that directly write the PANELMAP file format (E+H, ISIS Optronics)
Other import functions (e.g. ASCII files)
Export of *.jpg and *.bmp files
Export into *.html file format
Definition of any site pattern using a graphic editor
Automatic generation of Cartesian or circular site patterns
Extensive on-line help and HTML based user manual

Trend charts
Trend lists
X-Y-plots of statistical values
Global statistics ("All points, all panels")
Browser
Trend charts and lists can be sorted by any criterion (date & time, mean, max, min, std. dev. etc.)
Stacked maps
Operations with files
Direct import of measurement files into the SPC tool

Global operations (add, subtract, divide, square, square root, etc.)
1st and 2nd derivative of a map
File compare operations (add, multiply, ratio, average, etc.)
File operations are applicable to files with different site distributions
Shift (X and Y direction) and rotation of grids
Mirroring of maps along the X and Y axis
Multiple files can be open simultaneously
Multiple views of a single file can be selected and displayed simultaneously
Multiple views can be printed on a single sheet, printouts are configurable including company logo
Transformation of grids (Cartesian, circular) keeping same measurement feature
Merge data of different files (e.g. two measurements of one panel)
Sigma Sorting Filter (1, 2, 3 sigma)
Interpolation of sites

Advanced control of PANELMAP can be achieved via DDE linking to another application (availability depending on OS)